Areospace Rapid Rate Temperature Change Testing Chamber JEDEC (JESD 22-A104F)

This Rapid Temperature Change Rate Cycling Chamber is designed for accelerated product testing and reliability assessment in aerospace applications.

• Uniform temperature distribution: Creates consistent stress across test specimens with optimized airflow patterns calculated through simulation.
• Precise temperature control: High-speed controller manages test sample temperature variation rates up to 15°C/minute.
• JEDEC compliance: Meets JESD22-A104F standard requirements for semiconductor package and solder junction evaluations.
• Dual control modes: Supports both specimen temperature control (15°C/minute) and air temperature control for versatile testing applications.

Rapid change temperature testing addresses modern reliability challenges including higher device operation temperatures, advanced mounting methods (BGA/CSP), and lead-free solder requirements. Unlike thermal shock testing, this method provides highly repeatable results with controlled temperature variation rates ≤15°C/minute.